发明名称 RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for forming a resist pattern, by which a negative pattern can be formed with high resolution and in a favorable shape, and to provide a resist composition suitable to be used for the method. <P>SOLUTION: The method for forming a resist pattern includes the steps of: (1) forming a resist film 2 by coating a support body 1 with a resist composition containing a base component (A) that generates a base by exposure and increases the solubility with an alkali developing solution by an action of an acid; (2) exposing the resist film 2; (3) baking the resist film after the step (2); and forming a negative resist pattern by developing the resist film 2 with an alkali to dissolve and remove an unexposed portion 2b of the resist film 2. The resist composition used for the step (1) is also disclosed. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013122570(A) 申请公布日期 2013.06.20
申请号 JP20120140216 申请日期 2012.06.21
申请人 TOKYO OHKA KOGYO CO LTD 发明人 SHIMIZU HIROAKI;NAKAMURA TAKESHI;YOKOYA JIRO;NITO TAKEHITO
分类号 G03F7/038;C08F212/14;C08F220/36;C08F226/02;G03F7/004;G03F7/039;H01L21/027 主分类号 G03F7/038
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