发明名称 |
METHOD FOR SUNLIGHT TEST OF COSMETIC PRODUCTS |
摘要 |
PURPOSE: A sunlight test method of a cosmetic product is provided to replace real sunlight with Xenon light, and to shorten test time. CONSTITUTION: A sunlight test method of a cosmetic product comprises: a step of irradiating a cosmetic material by Xenon light; and a step of measuring image change of the cosmetic material by Xenon light. The intensity of Xenon light is 0.1W/m^2 to 1.45W/m^2 at a wavelength of 420 nm. The Xenon light is irradiated by a repeat mode of photoperiod and dark period or a constant mode of photoperiod. [Reference numerals] (AA) Intensity(W/m^2); (BB) Wavelength(nm)
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申请公布号 |
KR20130065055(A) |
申请公布日期 |
2013.06.19 |
申请号 |
KR20110131750 |
申请日期 |
2011.12.09 |
申请人 |
AMOREPACIFIC CORPORATION |
发明人 |
LEE, JAE KYOUNG;JEONG, HYE JIN |
分类号 |
G01N33/00;G01N21/31;G06T7/00 |
主分类号 |
G01N33/00 |
代理机构 |
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