发明名称 |
TESTING METHOD AND TESTING APPARATUS FOR TESTING FUNCTION OF ELECTRONIC APPARATUS |
摘要 |
A method for testing a function of an electronic apparatus is provided. The method includes steps of: searching for a location corresponding to the function to be tested, sending a command according to the location to perform the function to be tested, and determining whether an error occurs in the function according to a response from the function in response to the command.
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申请公布号 |
US2013145217(A1) |
申请公布日期 |
2013.06.06 |
申请号 |
US201213689900 |
申请日期 |
2012.11.30 |
申请人 |
MSTAR SEMICONDUCTOR, INC.;MSTAR SEMICONDUCTOR, INC. |
发明人 |
LIN YI-CHENG;LIN SHEN-PIN;HSIEH CHI-CHANG;KAO WEI-CHUN |
分类号 |
G06F11/36 |
主分类号 |
G06F11/36 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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