发明名称 TESTING METHOD AND TESTING APPARATUS FOR TESTING FUNCTION OF ELECTRONIC APPARATUS
摘要 A method for testing a function of an electronic apparatus is provided. The method includes steps of: searching for a location corresponding to the function to be tested, sending a command according to the location to perform the function to be tested, and determining whether an error occurs in the function according to a response from the function in response to the command.
申请公布号 US2013145217(A1) 申请公布日期 2013.06.06
申请号 US201213689900 申请日期 2012.11.30
申请人 MSTAR SEMICONDUCTOR, INC.;MSTAR SEMICONDUCTOR, INC. 发明人 LIN YI-CHENG;LIN SHEN-PIN;HSIEH CHI-CHANG;KAO WEI-CHUN
分类号 G06F11/36 主分类号 G06F11/36
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