发明名称 RESIST-PROTECTIVE FILM-FORMING COMPOSITION AND PATTERNING PROCESS
摘要 A pattern is printed by forming a photoresist layer on a wafer, forming a protective film thereon, exposure, and development. The protective film is formed from a composition comprising a copolymer of hydroxystyrene with acenaphthylene and/or vinylnaphthalene and a mixture of an alcohol solvent and an ether or aromatic solvent.
申请公布号 US2013143163(A1) 申请公布日期 2013.06.06
申请号 US201213706825 申请日期 2012.12.06
申请人 SHIN-ETSU CHEMICAL CO., LTD.;SHIN-ETSU CHEMICAL CO., LTD. 发明人 HATAKEYAMA JUN
分类号 C09D145/00;C08F216/10;C08F232/08;C09D129/02;G03F7/20 主分类号 C09D145/00
代理机构 代理人
主权项
地址