发明名称 |
RESIST-PROTECTIVE FILM-FORMING COMPOSITION AND PATTERNING PROCESS |
摘要 |
A pattern is printed by forming a photoresist layer on a wafer, forming a protective film thereon, exposure, and development. The protective film is formed from a composition comprising a copolymer of hydroxystyrene with acenaphthylene and/or vinylnaphthalene and a mixture of an alcohol solvent and an ether or aromatic solvent.
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申请公布号 |
US2013143163(A1) |
申请公布日期 |
2013.06.06 |
申请号 |
US201213706825 |
申请日期 |
2012.12.06 |
申请人 |
SHIN-ETSU CHEMICAL CO., LTD.;SHIN-ETSU CHEMICAL CO., LTD. |
发明人 |
HATAKEYAMA JUN |
分类号 |
C09D145/00;C08F216/10;C08F232/08;C09D129/02;G03F7/20 |
主分类号 |
C09D145/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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