发明名称
摘要 <p>Wafer treatment process and apparatus is provided with a wafer carrier arranged to hold wafers and to inject a fill gas into gaps between the wafers and the wafer carrier. The apparatus is arranged to vary the composition, flow rate, or both of the fill gas so as to counteract undesired patterns of temperature non-uniformity of the wafers.</p>
申请公布号 JP2013520833(A) 申请公布日期 2013.06.06
申请号 JP20120554991 申请日期 2010.12.14
申请人 发明人
分类号 H01L21/205;C23C16/46;H01L21/683 主分类号 H01L21/205
代理机构 代理人
主权项
地址
您可能感兴趣的专利