发明名称 Multiple-gate transistors with reverse T-shaped fins
摘要 A method of forming an integrated circuit structure includes forming a first insulation region and a second insulation region in a semiconductor substrate and facing each other; and forming an epitaxial semiconductor region having a reversed T-shape. The epitaxial semiconductor region includes a horizontal plate including a bottom portion between and adjoining the first insulation region and the second insulation region, and a fin over and adjoining the horizontal plate. The bottom of the horizontal plate contacts the semiconductor substrate. The method further includes forming a gate dielectric on a top surface and at least top portions of sidewalls of the fin; and forming a gate electrode over the gate dielectric.
申请公布号 US8455321(B2) 申请公布日期 2013.06.04
申请号 US201113294526 申请日期 2011.11.11
申请人 LAI LI-SHYUE;LIN JING-CHENG;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LAI LI-SHYUE;LIN JING-CHENG
分类号 H01L21/336 主分类号 H01L21/336
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