发明名称 Measurement of critical dimension
摘要 A spectroscopic instrument for conducting multi-wavelength, multi-azimuth, multi-angle-of-incidence readings on a substrate, the instrument having a broadband light source for producing an illumination beam, an objective for directing the illumination onto the substrate at multiple azimuth angles and multiple angles-of-incidence simultaneously, thereby producing a reflection beam, an aperture plate having an illumination aperture and a plurality of collection apertures formed therein for selectively passing portions of the reflection beam having desired discrete combinations of azimuth angle and angle-of-incident, a detector for receiving the discrete combinations of azimuth angle and angle-of-incident and producing readings, and a processor for interpreting the readings.
申请公布号 US8456639(B2) 申请公布日期 2013.06.04
申请号 US201113174815 申请日期 2011.07.01
申请人 KRISHNAN SHANKAR;WANG HAIMING;KLA-TENCOR CORPORATION 发明人 KRISHNAN SHANKAR;WANG HAIMING
分类号 G01N21/55;G01N21/00 主分类号 G01N21/55
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