发明名称 |
Semiconductor structure for MOSFET, has single well formed in contact with part of back gate of n-type double gate transistor and part of back gate of p-type double gate transistor, where gates are doped with same doping agent |
摘要 |
<p>The structure (1) has a n-type double gate transistor (1110) and a p-type double gate transistor (1210), which are formed with respective metal back gates (1101, 1201). Single well (1102) is formed in contact with a part of the back gate and a part of another back gate. An insulation trench (1400) electrically isolates the former back gate from the latter back gate. The back gates are doped with a same doping agent and electrically connected with each other. The well is formed in an area entirely recovering the back gates. The structure comprises silicon-on insulator substrate. An independent claim is also included for a method for manufacturing a semiconductor structure.</p> |
申请公布号 |
FR2983345(A1) |
申请公布日期 |
2013.05.31 |
申请号 |
FR20110060977 |
申请日期 |
2011.11.30 |
申请人 |
SOITEC |
发明人 |
ENDERS GERHARD;HOENLEIN WOLFGANG;HOFMANN FRANZ |
分类号 |
H01L21/8238;H01L27/085;H01L27/092 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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