发明名称 Semiconductor structure for MOSFET, has single well formed in contact with part of back gate of n-type double gate transistor and part of back gate of p-type double gate transistor, where gates are doped with same doping agent
摘要 <p>The structure (1) has a n-type double gate transistor (1110) and a p-type double gate transistor (1210), which are formed with respective metal back gates (1101, 1201). Single well (1102) is formed in contact with a part of the back gate and a part of another back gate. An insulation trench (1400) electrically isolates the former back gate from the latter back gate. The back gates are doped with a same doping agent and electrically connected with each other. The well is formed in an area entirely recovering the back gates. The structure comprises silicon-on insulator substrate. An independent claim is also included for a method for manufacturing a semiconductor structure.</p>
申请公布号 FR2983345(A1) 申请公布日期 2013.05.31
申请号 FR20110060977 申请日期 2011.11.30
申请人 SOITEC 发明人 ENDERS GERHARD;HOENLEIN WOLFGANG;HOFMANN FRANZ
分类号 H01L21/8238;H01L27/085;H01L27/092 主分类号 H01L21/8238
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