| 摘要 |
<P>PROBLEM TO BE SOLVED: To perform a test after packaging without providing a dedicated test terminal. <P>SOLUTION: A semiconductor storage device 1 includes: a memory bank 11; a memory bank 21; a controller 12 for the memory bank 11; and a controller 22 for the memory bank 21. The controller 12 utilizes an external terminal SCL2 for the memory bank 21 as a test terminal for the memory bank 11 in a test mode of the memory bank 11, and the controller 22 utilizes an external terminal SCL1 for the memory bank 11 as a test terminal for the memory bank 21 in a test mode of the memory bank 21. <P>COPYRIGHT: (C)2013,JPO&INPIT |
