发明名称 POLISHING DEVICE AND POLISHING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a polishing device capable of preventing excessive polishing. <P>SOLUTION: The polishing device (100) in an embodiment includes a stage (101), polishing parts (102, 104), a detection unit (110), and a lock mechanism (120). The stage (101) has a semiconductor substrate mounted thereon. The polishing parts (102, 104) grind a peripheral edge part of the semiconductor substrate from an upper side of the semiconductor substrate. The detection unit (110) detects a reference height position of the semiconductor substrate. The lock mechanism (120) restrains the movement of the polishing parts (102, 104) so that the further movement of the polishing parts (102, 104) to a semiconductor substrate face side is stopped, when polishing parts (102, 104) move by only a prescribed distance from the reference height position to the semiconductor substrate face side. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013103318(A) 申请公布日期 2013.05.30
申请号 JP20110250733 申请日期 2011.11.16
申请人 TOSHIBA CORP 发明人 ADACHI MASAYOSHI;SHIGETA ATSUSHI
分类号 B24B47/20;B24B49/10;H01L21/304 主分类号 B24B47/20
代理机构 代理人
主权项
地址