发明名称 |
Stage system, lithographic apparatus including such stage system, and correction method |
摘要 |
A position measurement system to measure a position of a movable stage includes a reference plate; a plurality of sensors arranged such that, depending on a position of the movable stage relative to the reference plate, at least a subset of the plurality of sensors is configured to cooperate with the reference plate to provide for each of the sensors in the subset respective sensor signals representative of a position of the respective sensor relative to the reference plate; and a processor arranged to determine from the sensor signals a stage position, the processing device configured so as to, when the stage is in a position where an over-determined number of sensor signals is provided by at least the subset of the sensors that are in operational cooperation with the reference plate, (a) determine the stage position from a subset of the over-determined number of sensor signals, and (b) correct a sensor signal of one or more of the sensors from a discrepancy between the determined stage position and a remainder of the sensors signals.
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申请公布号 |
US8451454(B2) |
申请公布日期 |
2013.05.28 |
申请号 |
US20080268659 |
申请日期 |
2008.11.11 |
申请人 |
KOENEN WILLEM HERMAN GERTRUDA ANNA;EUSSEN EMIEL JOZEF MELANIE;VAN DER PASCH ENGELBERTUS ANTONIUS FRANSISCUS;ASML NETHERLANDS B.V. |
发明人 |
KOENEN WILLEM HERMAN GERTRUDA ANNA;EUSSEN EMIEL JOZEF MELANIE;VAN DER PASCH ENGELBERTUS ANTONIUS FRANSISCUS |
分类号 |
G01B11/14;G03B27/42;G03B27/58;G03F7/20 |
主分类号 |
G01B11/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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