发明名称 NONVOLATILE MEMORY ELEMENT AND MEMORY DEVICE INCLUDING THE SAME
摘要 <p>PURPOSE: A nonvolatile memory element and a memory device including the same are provided to improve the reliability of a resistance change property by applying a buffer layer between a first electrode and a memory layer. CONSTITUTION: A memory element(ME1) includes a first electrode, a second electrode, and a memory layer. The memory layer is formed between the first electrode and the second electrode and includes a first material layer(10) and a second material layer(20). The memory layer has a resistance change property due to the movement of ionic species between the first material layer and the second material layer. The first metal layer is doped with a metal.</p>
申请公布号 KR20130052371(A) 申请公布日期 2013.05.22
申请号 KR20110117779 申请日期 2011.11.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, CHANG BUM;KIM, YOUNG BAE;KIM, KYUNG MIN;KIM, CHANG JUNG;LEE, DONG SOO;LEE, MYOUNG JAE;LEE, SEUNG RYUL;CHANG, MAN
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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