发明名称 |
Method for sorting and acquiring semiconductor element, method for producing semiconductor device, and semiconductor device |
摘要 |
A method for sorting and acquiring a semiconductor element, including: disposing a plurality of semiconductor elements in an effective section in a semiconductor substrate; disposing a standard semiconductor element outside of the effective section in the semiconductor substrate; forming a bump in each of the plurality of the semiconductor elements and in the standard semiconductor element; performing a test on the plurality of the semiconductor elements in the effective section; forming a location map using the standard semiconductor element as a base point; and picking up the semiconductor elements determined as non-defective in the test from the plurality of the semiconductor elements based on the location map.
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申请公布号 |
US8445906(B2) |
申请公布日期 |
2013.05.21 |
申请号 |
US20100690198 |
申请日期 |
2010.01.20 |
申请人 |
KONNO YOSHITO;YAMADA YUTAKA;FUJITSU SEMICONDUCTOR LIMITED |
发明人 |
KONNO YOSHITO;YAMADA YUTAKA |
分类号 |
H01L23/58 |
主分类号 |
H01L23/58 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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