发明名称 OPTICAL MECHANISM FOR EUV LITHOGRAPHY, AND METHOD FOR CONSTITUTING OPTICAL MECHANISM
摘要 <P>PROBLEM TO BE SOLVED: To provide an optical mechanism for EUV lithography reducing deformation caused by an influence of a temperature, and to provide a method for constituting the optical mechanism having especially a projection lens and an optical element. <P>SOLUTION: This optical mechanism includes a second mirror 22 including a reflection surface 31a and a substrate 32 constituted of TiO<SB POS="POST">2</SB>-doped quartz glass having a temperature-dependent thermal expansion coefficient having zero crossing at a first zero-cross temperature T<SB POS="POST">ZC1</SB>, and a second optical element including a reflection surface and a second substrate constituted of TiO<SB POS="POST">2</SB>-doped quartz glass having a temperature-dependent thermal expansion coefficient having zero crossing at a second zero-cross temperature which is different from the first zero-cross temperature, wherein the gradient (&Delta;CTE<SB POS="POST">1</SB>>) of the thermal expansion coefficient of the first substrate 32 at the first zero-cross temperature and/or the gradient (&Delta;CTE<SB POS="POST">2</SB>) of the thermal expansion coefficient of the second substrate at the second zero-cross temperature have a negative sign, respectively. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013095659(A) 申请公布日期 2013.05.20
申请号 JP20120136845 申请日期 2012.06.18
申请人 CARL ZEISS SMT GMBH 发明人 CLAUSS WILFRIED
分类号 C03C3/06;C03B20/00;C03C17/10;G02B19/00;G03F7/20;H01L21/027 主分类号 C03C3/06
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