发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, AND ELECTRONIC APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To form a through electrode inside a through hole by metal plating even if the through hole included in a semiconductor device is miniaturized. <P>SOLUTION: A method of manufacturing a semiconductor device 100 includes: a seed layer formation step of forming a seed layer 30 on a first surface 10a side of a substrate 10; a wiring layer formation step of forming a wiring layer 40 on the seed layer 30 after the seed layer formation step; a through hole formation step of forming a through hole 10c reaching the seed layer 30 from a second surface 10b of the substrate 10 after the wiring layer formation step; a through electrode formation step of forming a through electrode 60 inside the through hole 10c by metal plating after the through hole formation step; and a dividing step of dividing the seed layer 30 into a plurality of parts after the through electrode formation step. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013098369(A) |
申请公布日期 |
2013.05.20 |
申请号 |
JP20110240065 |
申请日期 |
2011.11.01 |
申请人 |
SEIKO EPSON CORP |
发明人 |
KOIKE SHIGEMITSU |
分类号 |
H01L23/522;H01L21/3205;H01L21/768 |
主分类号 |
H01L23/522 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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