发明名称 |
ELECTRODE STRUCTURE, GALLIUM NITRIDE-BASED SEMICONDUCTOR ELEMENT PROVIDED WITH THE SAME, AND METHOD FOR MANUFACTURING THEM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an electrode structure, a gallium nitride-based semiconductor element provided with the same, and a method for manufacturing them. <P>SOLUTION: The gallium nitride-based semiconductor element includes a GaN-based semiconductor layer GL10, and electrode structures 500A and 500B provided on the GaN-based semiconductor layer. The electrode structures 500A and 500B include electrode elements 50A and 50B containing conductive substances, and diffusion layers 5A and 5B provided between the electrode elements 50A and 50B and a GaN-based semiconductor layer 200. The diffusion layers 5A and 5B contain an n-type dopant, the n-type dopant contains a group-IV element, and a region of the GaN-based semiconductor layer 200 in contact with the diffusion layers is doped with the n-type dopant (for instance, group-IV element). <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013098556(A) |
申请公布日期 |
2013.05.20 |
申请号 |
JP20120235473 |
申请日期 |
2012.10.25 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
LEE JEONG-YUB;XIANYU WENXU;MOON CHANG-YOUL;PARK YONG YONG;YANG WU-YEONG;WHANG IN-JUN |
分类号 |
H01L21/338;H01L21/28;H01L21/336;H01L29/417;H01L29/778;H01L29/78;H01L29/812 |
主分类号 |
H01L21/338 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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