发明名称 ELECTRODE STRUCTURE, GALLIUM NITRIDE-BASED SEMICONDUCTOR ELEMENT PROVIDED WITH THE SAME, AND METHOD FOR MANUFACTURING THEM
摘要 <P>PROBLEM TO BE SOLVED: To provide an electrode structure, a gallium nitride-based semiconductor element provided with the same, and a method for manufacturing them. <P>SOLUTION: The gallium nitride-based semiconductor element includes a GaN-based semiconductor layer GL10, and electrode structures 500A and 500B provided on the GaN-based semiconductor layer. The electrode structures 500A and 500B include electrode elements 50A and 50B containing conductive substances, and diffusion layers 5A and 5B provided between the electrode elements 50A and 50B and a GaN-based semiconductor layer 200. The diffusion layers 5A and 5B contain an n-type dopant, the n-type dopant contains a group-IV element, and a region of the GaN-based semiconductor layer 200 in contact with the diffusion layers is doped with the n-type dopant (for instance, group-IV element). <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013098556(A) 申请公布日期 2013.05.20
申请号 JP20120235473 申请日期 2012.10.25
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 LEE JEONG-YUB;XIANYU WENXU;MOON CHANG-YOUL;PARK YONG YONG;YANG WU-YEONG;WHANG IN-JUN
分类号 H01L21/338;H01L21/28;H01L21/336;H01L29/417;H01L29/778;H01L29/78;H01L29/812 主分类号 H01L21/338
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