发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device in which a defect in signal writing to a transistor caused by voltage drop or signal delay due to wiring resistance is prevented, e.g., to provide a display device which achieves high display quality by preventing a defect in grayscale caused by a defect in writing to a transistor provided in a pixel of the display device. <P>SOLUTION: A transistor is manufactured in which wiring including copper with low wiring resistance is connected to a highly purified oxide semiconductor having a wide band gap and a reduced carrier concentration. Use of an oxide semiconductor with a wide band gap enables off-current of a transistor to be reduced. In addition, when such an oxide semiconductor is highly purified and has a reduced carrier concentration, a transistor has a positive threshold voltage. That is, a so-called normally off transistor can be provided to make the ratio between off-current and on-current higher. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013093621(A) 申请公布日期 2013.05.16
申请号 JP20130022959 申请日期 2013.02.08
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;HOSOHANE MIYUKI;HIRAISHI SUZUNOSUKE
分类号 H01L29/786;H01L21/28;H01L21/336;H01L29/417;H01L29/423;H01L29/49 主分类号 H01L29/786
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