发明名称 |
METHOD FOR MEASURING ABSORPTION SPECTRUM AND MONOCHROMATOR THEREOF |
摘要 |
PURPOSE: An absorption spectrum measuring method and a spectroscope are provided to optimally maintain the intensity of X-rays for measuring an absorption spectrum and to predict a proper detuning angle of a DCM(Double Crystal Monochromator) crystal. CONSTITUTION: An absorption spectrum measuring method is as follows. A rate of fundamental harmonics to 3rd-order harmonics is calculated based on a difference of an X-ray absorption of a plurality of media with respect to X-rays having energy larger than the absorption edge and an X-ray absorption of a plurality of media with respect to X-rays having energy smaller than the absorption edge(S310). An angle of a crystal of DCM is adjusted based on the rate of the fundamental harmonics with respect to the 3rd-order harmonics and the absorption spectrum of a sample is measured(S320). [Reference numerals] (AA) Start; (BB) End; (S310) Calculate the ratio of fundamental harmonics to 3rd-order harmonics; (S320) Adjust the angle between a first crystal and a second crystal |
申请公布号 |
KR20130050786(A) |
申请公布日期 |
2013.05.16 |
申请号 |
KR20110116030 |
申请日期 |
2011.11.08 |
申请人 |
POSTECH ACADEMY-INDUSTRY FOUNDATION |
发明人 |
SUNG, NARK EON |
分类号 |
G01N23/06;G01N23/223 |
主分类号 |
G01N23/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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