发明名称 |
OXIDE SEMICONDUCTOR FILM AND SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To inhibit an occurrence of oxygen defect. <P>SOLUTION: An oxide semiconductor film is composed of germanium (Ge) instead of the whole or a part of gallium (Ga) or stannum (Sn). A germanium (Ge) atom has at least one bond energy with an oxygen (O) atom higher than that of gallium (Ga) or stannum (Sn). Because of this, oxygen defect is not likely to occur when an oxide semiconductor crystal is composed of germanium (Ge). Accordingly, by composing the oxide semiconductor film by germanium (Ge), an occurrence of oxygen defect is inhibited. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013093561(A) |
申请公布日期 |
2013.05.16 |
申请号 |
JP20120210269 |
申请日期 |
2012.09.25 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;NAKAJIMA MOTOI |
分类号 |
H01L21/363;C01G17/00;C01G19/00;C23C14/34;H01L21/336;H01L21/8242;H01L21/8247;H01L27/10;H01L27/108;H01L27/115;H01L29/786;H01L29/788;H01L29/792 |
主分类号 |
H01L21/363 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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