发明名称 OXIDE SEMICONDUCTOR FILM AND SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To inhibit an occurrence of oxygen defect. <P>SOLUTION: An oxide semiconductor film is composed of germanium (Ge) instead of the whole or a part of gallium (Ga) or stannum (Sn). A germanium (Ge) atom has at least one bond energy with an oxygen (O) atom higher than that of gallium (Ga) or stannum (Sn). Because of this, oxygen defect is not likely to occur when an oxide semiconductor crystal is composed of germanium (Ge). Accordingly, by composing the oxide semiconductor film by germanium (Ge), an occurrence of oxygen defect is inhibited. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013093561(A) 申请公布日期 2013.05.16
申请号 JP20120210269 申请日期 2012.09.25
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;NAKAJIMA MOTOI
分类号 H01L21/363;C01G17/00;C01G19/00;C23C14/34;H01L21/336;H01L21/8242;H01L21/8247;H01L27/10;H01L27/108;H01L27/115;H01L29/786;H01L29/788;H01L29/792 主分类号 H01L21/363
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