发明名称 VOLTAGE-DROP TESTING SYSTEM, VOLTAGE-DROP CONTROL APPARATUS, AND METHOD THEREOF
摘要 A voltage-drop testing system, including a voltage-drop control apparatus, and a voltage-drop testing method adapted for the voltage-drop testing system based on LABVIEW department platform. When the LABVIEW department platform 12 is running, different groups of test data may be transferred to the PLD tester 20, when the PLD tester 20 finishes the testing based on all groups of test data, the PLD tester 20 feeds back the test results to the LABVIEW department platform 12, and the LABVIEW department platform 12 creates the voltage-drop testing graphic frame displaying the test results for the electronic device under test 2 for the convenience of a user.
申请公布号 US2013120001(A1) 申请公布日期 2013.05.16
申请号 US201213421858 申请日期 2012.03.15
申请人 CHEN TSUNG-YUAN;HOU KUEI-CHIH;CHIANG WEN-KAI;HON HAI PRECISION INDUSTRY CO., LTD. 发明人 CHEN TSUNG-YUAN;HOU KUEI-CHIH;CHIANG WEN-KAI
分类号 G01R31/02 主分类号 G01R31/02
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