发明名称 MEASURING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a measuring apparatus capable of performing arithmetic processing for a measurement value. <P>SOLUTION: An impedance measuring apparatus 1 includes measurement control means for allowing a measurement part 2 to execute a plurality of measurement processing operations based on preset measurement conditions in predetermined order and arithmetic means for operating an input operation area 23a of an arithmetic expression input setting window 23 displayed on a touch panel 10 by using measurement values measured by the measurement part 2 in accordance the measurement conditions and performing operation by an arithmetic expression displayed on a preset arithmetic expression display area 23b. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013088392(A) 申请公布日期 2013.05.13
申请号 JP20110231748 申请日期 2011.10.21
申请人 HIOKI EE CORP 发明人 SAKURAI HIRONORI;OGAWA TSUNEO;MORIKAKU TAKURO;YAMAGUCHI TSUTOMU
分类号 G01R27/02;G01R27/26 主分类号 G01R27/02
代理机构 代理人
主权项
地址