发明名称 INSPECTION METHOD AND MANUFACTURING METHOD OF SILICON BLOCK, MANUFACTURING METHOD OF SILICON WAFER, MANUFACTURING METHOD OF SOLAR CELL ELEMENT, AND MANUFACTURING METHOD OF SOLAR CELL MODULE
摘要 <P>PROBLEM TO BE SOLVED: To provide an inspection method of a silicon block which allows for simple evaluation of the oxygen concentration in silicon in a state of silicon block. <P>SOLUTION: The inspection method of a silicon block cut out from a polysilicon ingot formed by unidirectional solidification includes a lifetime measurement step for measuring the lifetime of minority carriers of a silicon block, and an oxygen concentration calculation step for calculating the oxygen concentration of the silicon block from the lifetime measured in the lifetime measurement step. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013089794(A) 申请公布日期 2013.05.13
申请号 JP20110229529 申请日期 2011.10.19
申请人 SHARP CORP 发明人 OISHI RYUICHI
分类号 H01L31/04 主分类号 H01L31/04
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