MULTIPLY-SAMPLED CMOS SENSOR FOR X-RAY DIFFRACTION MEASUREMENTS WITH CORRECTIONS FOR NON-IDEAL SENSOR BEHAVIOR

摘要

Readout noise for each pixel in a CMOS Active Pixel Sensor is reduced by a five step process in which the pixel charge data from the sensor is nondestructively sampled at a plurality of times during a sensor frame time period and corrected for gain variation and nonlinearity. Then fixed pattern 5 and dark current noise is estimated and subtracted from the corrected pixel charge data. Next, reset noise is estimated and subtracted from the pixel charge data. In step four, a model function of charge versus time is fit to the corrected pixel charge data samples. Finally, the fitted model function is evaluated at frame boundary times.