发明名称 |
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MODULE HAVING THE SAME |
摘要 |
<P>PROBLEM TO BE SOLVED: To perform an accurate impedance calibration operation of a data output buffer. <P>SOLUTION: A semiconductor device includes: a P type transistor unit 201 connected between a power line VL1 and a data terminal 24; P type transistor units 111-114 connected between the power line VL1 and a calibration terminal ZQ; and an impedance control circuit for adjusting impedances of the P type transistor units 111-114 such that a potential of the calibration terminal ZQ matches a reference potential VREF, and reflecting the impedance of one of the P type transistor units 111-114 in the matching state in the P type transistor unit 201. This can provide an accurate calibration operation even if the reference potential VREF is set at a level offset from half the level of a supply potential VDD. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013085078(A) |
申请公布日期 |
2013.05.09 |
申请号 |
JP20110222935 |
申请日期 |
2011.10.07 |
申请人 |
ELPIDA MEMORY INC;HITACHI ULSI SYSTEMS CO LTD |
发明人 |
HARA KENTARO |
分类号 |
H03K19/0175;H01L21/822;H01L27/04 |
主分类号 |
H03K19/0175 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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