发明名称 PHOTORESIST AND POST ETCH RESIDUE CLEANING SOLUTION
摘要 A photoresist and post etch cleaning solution for semiconductor wafers comprising: A. a polar aprotic solvent, B. an inorganic base; C. a co-solvent for said inorganic base; D. a unsaturated cycloaliphatic compound having a ring ether group and at least one substituent bearing a primary hydroxyl group; E. an organic base comprising an amine compound; and F. a nonionic surfactant bearing at least one ether group. The wafer containing photoresist residue or post etch residue can be cleaned by contacting the solution in a spray or immersion.
申请公布号 US2013116159(A1) 申请公布日期 2013.05.09
申请号 US201213651790 申请日期 2012.10.15
申请人 DYNALOY, LLC;DYNALOY, LLC 发明人 POLLARD KIMBERLY DONA;PFETTSCHER DONALD;HATFIELD MEAGAN;HOCHSTETLER SPENCER ERICH;WHEELER NICHELLE M.;PHENIS MICHAEL T.
分类号 C11D3/60;G03F7/42 主分类号 C11D3/60
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