发明名称 PARTICLE BEAM IRRADIATION SYSTEM AND CHARGED PARTICLE BEAM CORRECTING METHOD
摘要 PURPOSE: A corpuscular radiation treatment system and a charged particle beam compensation method are provided to increase beam efficiency by not decreasing uniformity of irradiation. CONSTITUTION: A synchrotron(13) accelerates and emits ion beam(10). An irradiator(30) irradiates the ion beam emitted from the synchrotron. An accumulated beam charge measurement unit(15) measures accumulated beam charge in the synchrotron. A target current configuration unit sets up a target beam current value emitted from the synchrotron based on the accumulated beam charge measured in the accumulated beam charge measurement unit. An emitted beam current correction control unit controls beam current based on a target value of the emitted beam current calculated from the target current configuration unit.
申请公布号 KR20130047675(A) 申请公布日期 2013.05.08
申请号 KR20120122127 申请日期 2012.10.31
申请人 KABUSHIKI KAISHA HITACHI SEISAKUSHO(D 发明人 NISHIUCHI HIDEAKI;FUJITAKA SHINICHIRO
分类号 H05H13/04;A61N5/10;G21K5/04 主分类号 H05H13/04
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