发明名称 |
IMAGE QUALITY INSPECTION METHOD, IMAGE QUALITY INSPECTION DEVICE, AND IMAGE QUALITY INSPECTION PROGRAM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an image quality inspection device capable of identifying a foreign attachment to a screen and a pixel defect thereof. <P>SOLUTION: An image quality inspection device includes: a candidate area extraction part 21 for instructing a white pattern to an LCD 31 and extracting a candidate area from a white pattern of an imaged screen; a bright spot abnormality detection part 22 for instructing a black pattern to the LCD and obtaining an RGB value difference at a time of detecting a bright spot abnormality around the candidate area if there is a candidate area including a pixel of a bright spot abnormality from the black pattern of the imaged screen; a dark spot abnormality detection part 23 for instructing a white display of pixels in the candidate area while the black pattern is displayed and obtaining a current RGB value difference around the candidate area from the imaged screen; and an abnormality identification part 24 for identifying as an abnormality due to a foreign attachment if the current RGB value difference exceeds the RGB value difference at the time of detecting the bright spot abnormality, or identifying as an abnormality due to a pixel defect of a dark spot if the current RGB value difference does not exceed the RGB value difference at the time of detecting the bright spot abnormality. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013079880(A) |
申请公布日期 |
2013.05.02 |
申请号 |
JP20110220402 |
申请日期 |
2011.10.04 |
申请人 |
FUJITSU LTD |
发明人 |
YANASE TAKESHI;OBA HIDETOSHI |
分类号 |
G01M11/00;G01N21/88;G02F1/13 |
主分类号 |
G01M11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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