发明名称 |
IMPLEMENTING SCREENING FOR SINGLE FET COMPARE OF PHYSICALLY UNCLONABLE FUNCTION (PUF) |
摘要 |
A screening method and circuit for implementing a Physically Unclonable Function (PUF), and a design structure on which the subject circuit resides are provided. A plurality of field effect transistors (FETs) is coupled to a low-offset dynamic comparator and is respectively selected to provide a plurality of FET pairs. For each FET pair, a voltage offset to obtain a comparator output transition is identified and recorded. The recorded voltage offset for each FET pair is compared with a margin threshold value. Each FET pair having an identified voltage offset less than the margin threshold value is discarded or disabled for PUF response generation use.
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申请公布号 |
US2013106461(A1) |
申请公布日期 |
2013.05.02 |
申请号 |
US201113284239 |
申请日期 |
2011.10.28 |
申请人 |
FICKE JOEL T.;KESSELRING GRANT P.;STROM JAMES D.;INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
FICKE JOEL T.;KESSELRING GRANT P.;STROM JAMES D. |
分类号 |
H03K19/00;G06F17/50 |
主分类号 |
H03K19/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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