Measuring assembly and method for measuring a three-dimensionally extended structure,申请号EP20070017870-传众专利搜索

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发明名称	Measuring assembly and method for measuring a three-dimensionally extended structure
摘要
申请公布号	EP1901031(B1)	申请公布日期	2013.05.01
申请号	EP20070017870	申请日期	2007.09.12
申请人	MICRO-EPSILON OPTRONIC GMBH	发明人	STAUTMEISTER, TORSTEN, DIPL.-ING.;SCHUELLER, TOBIAS, DR.-ING.
分类号	G01B11/24;G01B11/25	主分类号	G01B11/24
代理机构		代理人
主权项
地址

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