发明名称 SUBCRITICAL REACTIVITY MEASUREMENT METHOD
摘要 <p>A method of determining the spatially corrected inverse count ratio (SCICR) used to determine reactor criticality, which subtracts a background noise signal from the source range detector output. The method monitors the source range detector signal at two different core temperature levels during a transient portion of the detector output as the power output of the reactor is increased in the source range. This information is employed to analytically determine the background noise signal, which is then subtracted from the detector outputs to obtain the SCICR reactivity measurement.</p>
申请公布号 SI2366185(T1) 申请公布日期 2013.04.30
申请号 SI20090030415T 申请日期 2009.10.05
申请人 WESTINGHOUSE ELECTRIC COMPANY LLC 发明人 SEBASTIANI PATRICK J.
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