| 摘要 |
An apparatus for testing of a plurality of electronic devices on a flexible substrate is described. The apparatus includes at least two rollers (110) configured for guiding the flexible substrate (10) into a testing area along transport direction, at least one prober (122) configured for electrically contacting one or more of the electronic devices, at least one probing support (124) configured for supporting a portion of the flexible substrate during electrical contact with the at least one prober, and a test device for functional testing of one or more of the electronic devices. |
