| 摘要 |
Provided are a generation device to reduce launch switching activity, yield loss risk, and power consumption of testing, even in the at-speed scan testing, even with a small number of don't-care (X) bits in input bits as in test compression, without any impact on test data volume, fault coverage, performance, and circuit design, by putting focus on internal lines in the circuit. The generation device includes a target internal line selection unit, a target internal line distinction unit, an identification unit that identifies a bit to be an unspecified bit and a bit to be a logic bit in the input bits, and an assignment unit that assigns a logic value 1 or a logic value 0 to unspecified bits in the input bits. The identification unit includes an unspecified bit identification unit and an input logic bit identification unit. |
