发明名称 |
Lithography Mask and Method of Forming a Lithography Mask |
摘要 |
A first embodiment is a lithography mask comprising a transparent substrate and a first molybdenum silicon nitride (MoxSiyNz) layer. The first MoxSiyNz layer is over the transparent substrate. A percentage of molybdenum (x) of the first MoxSiyNz layer is between 1 and 2. A percentage of silicon (y) of the first MoxSiyNz layer is between 50 and 55. A percentage of nitride (z) of the first MoxSiyNz layer is between 40 and 50. The first MoxSiyNz layer has an opening therethrough.
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申请公布号 |
US2013095414(A1) |
申请公布日期 |
2013.04.18 |
申请号 |
US201113324755 |
申请日期 |
2011.12.13 |
申请人 |
YOO CHUE-SAN;CHEN CHUN-LANG;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
YOO CHUE-SAN;CHEN CHUN-LANG |
分类号 |
G03F1/00;G03F1/68 |
主分类号 |
G03F1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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