发明名称 Lithography Mask and Method of Forming a Lithography Mask
摘要 A first embodiment is a lithography mask comprising a transparent substrate and a first molybdenum silicon nitride (MoxSiyNz) layer. The first MoxSiyNz layer is over the transparent substrate. A percentage of molybdenum (x) of the first MoxSiyNz layer is between 1 and 2. A percentage of silicon (y) of the first MoxSiyNz layer is between 50 and 55. A percentage of nitride (z) of the first MoxSiyNz layer is between 40 and 50. The first MoxSiyNz layer has an opening therethrough.
申请公布号 US2013095414(A1) 申请公布日期 2013.04.18
申请号 US201113324755 申请日期 2011.12.13
申请人 YOO CHUE-SAN;CHEN CHUN-LANG;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 YOO CHUE-SAN;CHEN CHUN-LANG
分类号 G03F1/00;G03F1/68 主分类号 G03F1/00
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