发明名称 COMPOUND SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a compound semiconductor device and a manufacturing method of the same, which can achieve a normally-off operation while inhibiting deterioration of properties. <P>SOLUTION: A compound semiconductor device of an embodiment comprises: a substrate 1; an electron transit layer 3 and an electron supply layer 5 which are formed above the substrate 1; a gate electrode 11g, a source electrode 11s and a drain electrode 11d which are formed above the electron supply layer 5; and a p-type semiconductor layer 8 formed between the electron supply layer 5 and the gate electrode 11g. At least an element of the same sort as an element composing either of the electron transit layer 3 or the electron supply layer 5 is used as a p-type impurity contained in the p-type semiconductor layer 8. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013069992(A) 申请公布日期 2013.04.18
申请号 JP20110209172 申请日期 2011.09.26
申请人 FUJITSU LTD 发明人 YAMADA ATSUSHI
分类号 H01L21/338;H01L21/336;H01L21/8234;H01L27/06;H01L27/088;H01L27/095;H01L29/778;H01L29/78;H01L29/812;H01L29/861;H01L29/868 主分类号 H01L21/338
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