发明名称 |
DEFECT INSPECTION DEVICE, COMPONENT MOUNTING SYSTEM, DEFECT INSPECTION METHOD AND PROGRAM |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a defect inspection device capable of exactly detecting the presence or the absence of defects on the basis of an image which is obtained by imaging a substrate. <P>SOLUTION: A solder area for a pad is calculated from each of print substrate image data which is obtained by imaging a substrate after a solder printing process and component mounting substrate image data which is obtained by imaging a substrate after a component mounting process. On the basis of change amounts in a solder area for a pad after the solder printing process and the component mounting process, determination is made as to whether a soldering defect occurs in a pad. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013068559(A) |
申请公布日期 |
2013.04.18 |
申请号 |
JP20110208643 |
申请日期 |
2011.09.26 |
申请人 |
NEC CORP |
发明人 |
NAKAHARA TATSUFUSA;NAKA HIROSHI;UENO YOSHINORI |
分类号 |
G01N21/956;H05K3/34;H05K13/08 |
主分类号 |
G01N21/956 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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