发明名称 DEFECT INSPECTION DEVICE, COMPONENT MOUNTING SYSTEM, DEFECT INSPECTION METHOD AND PROGRAM
摘要 <P>PROBLEM TO BE SOLVED: To provide a defect inspection device capable of exactly detecting the presence or the absence of defects on the basis of an image which is obtained by imaging a substrate. <P>SOLUTION: A solder area for a pad is calculated from each of print substrate image data which is obtained by imaging a substrate after a solder printing process and component mounting substrate image data which is obtained by imaging a substrate after a component mounting process. On the basis of change amounts in a solder area for a pad after the solder printing process and the component mounting process, determination is made as to whether a soldering defect occurs in a pad. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013068559(A) 申请公布日期 2013.04.18
申请号 JP20110208643 申请日期 2011.09.26
申请人 NEC CORP 发明人 NAKAHARA TATSUFUSA;NAKA HIROSHI;UENO YOSHINORI
分类号 G01N21/956;H05K3/34;H05K13/08 主分类号 G01N21/956
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