发明名称 MANUFACTURING METHOD OF SUBSTRATE HAVING BUFFER LAYER STRUCTURE FOR GROWING NITRIDE SEMICONDUCTOR LAYER
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a substrate having a buffer layer structure which is improved for growing a semiconductor laminate structure for a nitride semiconductor device. <P>SOLUTION: The manufacturing method of a substrate having a buffer layer structure for growing a nitride semiconductor layer comprises the processes of: depositing a first AlN buffer layer (2a) at a substrate temperature within a range of 600&deg;C or higher and 900&deg;C or lower on a (111) principal plane of a Si single crystal substrate (1); and depositing a second AlN buffer layer (2b) at a substrate temperature exceeding 900&deg;C on the first AlN buffer layer. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013069983(A) 申请公布日期 2013.04.18
申请号 JP20110209031 申请日期 2011.09.26
申请人 SHARP CORP 发明人 HONDA DAISUKE;TERAGUCHI NOBUAKI;ITO NOBUYUKI;HOTEIDA NOBUYUKI;MATSUBAYASHI MASAKAZU
分类号 H01L21/205;C23C16/34 主分类号 H01L21/205
代理机构 代理人
主权项
地址