发明名称 Apparatus and method of measuring integrity
摘要 Provided are an apparatus and method of measuring integrity, in which unnecessary memory loading of an object for measuring integrity is avoided. The apparatus includes a mapping module loading at least one second object, among a plurality of second objects divided from a first object in accordance with an allocation unit of a memory, into the memory, a memory module storing a hash value of the divided second object, and a measurement module measuring integrity of the first object by comparing a hash value of the loaded at least one second object with the hash value stored in the memory module.
申请公布号 US8423787(B2) 申请公布日期 2013.04.16
申请号 US20070655213 申请日期 2007.01.19
申请人 CHOI HYUN-JIN;JUNG KYUNG-IM;JUNG MYUNG-JUNE;SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI HYUN-JIN;JUNG KYUNG-IM;JUNG MYUNG-JUNE
分类号 G06F21/00 主分类号 G06F21/00
代理机构 代理人
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