发明名称 Field effect transistor having MOS structure made of nitride compound semiconductor
摘要 A semiconductor layer of a second conductive type is formed on a RESURF layer of a first conductive type that is formed on a buffer layer. A contact layer of the first conductive type is formed in or on the semiconductor layer. A source electrode is formed on the contact layer. A drain electrode is formed on the RESURF layer. A gate insulating film is formed on the semiconductor layer to overlap with an end of the semiconductor layer. A gate electrode is formed on the gate insulating film to overlap with the end of the semiconductor layer. A channel formed near the end of the semiconductor layer is electrically connected to the RESURF layer.
申请公布号 US8421182(B2) 申请公布日期 2013.04.16
申请号 US20090639199 申请日期 2009.12.16
申请人 NOMURA TAKEHIKO;YOSHIDA SEIKOH;KATO SADAHIRO;FURUKAWA ELECTRIC CO., LTD. 发明人 NOMURA TAKEHIKO;YOSHIDA SEIKOH;KATO SADAHIRO
分类号 H01L31/062 主分类号 H01L31/062
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