发明名称 Schottky barrier diode with perimeter capacitance well junction
摘要 A Schottky barrier diode comprises a first-type substrate, a second-type well isolation region on the first-type substrate, and a first-type well region on the second-type well isolation region. With embodiments herein a feature referred to as a perimeter capacitance well junction ring is on the second-type well isolation region. A second-type well region is on the second-type well isolation region. The perimeter capacitance well junction ring is positioned between and separates the first-type well region and the second-type well region. A second-type contact region is on the second-type well region, and a first-type contact region contacts the inner portion of the first-type well region. The inner portion of the first-type well region is positioned within the center of the first-type contact region. Additionally, a first ohmic metallic layer is on the first-type contact region and a second ohmic metallic layer is on the first-type well region. The first ohmic metallic layer contacts the second ohmic metallic layer at a junction that makes up the Schottky barrier of the Schottky barrier diode.
申请公布号 US8421181(B2) 申请公布日期 2013.04.16
申请号 US20100840791 申请日期 2010.07.21
申请人 ANDERSON FREDERICK G.;LARY JENIFER E.;RASSEL ROBERT M.;STIDHAM MARK E.;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ANDERSON FREDERICK G.;LARY JENIFER E.;RASSEL ROBERT M.;STIDHAM MARK E.
分类号 H01L29/66 主分类号 H01L29/66
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