发明名称 Integrated circuit system with ultra-low k dielectric and method of manufacture thereof
摘要 A method of manufacturing an integrated circuit system includes: providing a etch stop layer; forming a layer stack over the etch stop layer with the layer stack having an anti-reflective coating layer over a low temperature oxide layer; forming a photoresist layer over the anti-reflective coating layer; forming a first resist line and a second resist line from the photoresist layer with the first resist line and the second resist line separated by a through line pitch on the anti-reflective coating layer; etching the anti-reflective coating layer using a low-pressure polymer burst with a non-oxidizing gas mixture to remove a portion of the anti-reflective coating layer; and forming a first polymer layer over the first resist line.
申请公布号 US8420947(B2) 申请公布日期 2013.04.16
申请号 US20100982363 申请日期 2010.12.30
申请人 SRIVASTAVA RAVI PRAKASH;GLOBALFOUNDRIES SINGAPORE PTE. LTD. 发明人 SRIVASTAVA RAVI PRAKASH
分类号 H05K1/03 主分类号 H05K1/03
代理机构 代理人
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