Methods for Testing Manufactured Products

摘要

The problem of high test cost of manufactured goods can be partially solved by lowering the percentage of the goods to be tested methodically while keeping the total defective portion of the goods expressed in DPPM below a preset target value. The method includes identifying a first test that is capable of screening out enough parts that would fail a second test so that the portion of the parts to be tested second test can be reduced. The number of parts screened out by the first test determines if the reduced testing scheme would violate the preset DPPM target value.