发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND SUBSTRATE PROCESSING APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To improve the film thickness uniformity in a wafer surface. <P>SOLUTION: A manufacturing method of a semiconductor device includes the steps of: supplying a process gas to a discharge chamber which is defined on an inner peripheral surface of a processing chamber 12, where multiple substrates are laminated and housed, and houses a pair of electrodes therein; applying electric power to the electrode to form plasma thereby activating the process gas. The steps are performed and the substrate is processed using the activated process gas. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2013065872(A) |
申请公布日期 |
2013.04.11 |
申请号 |
JP20120249258 |
申请日期 |
2012.11.13 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC |
发明人 |
TOYODA KAZUYUKI;INOKUCHI YASUHIRO;TAKEBAYASHI MOTONARI;KONYA TADASHI;ISHIMARU NOBUO |
分类号 |
H01L21/316;H01L21/31;H01L21/318 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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