发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE AND SUBSTRATE PROCESSING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To improve the film thickness uniformity in a wafer surface. <P>SOLUTION: A manufacturing method of a semiconductor device includes the steps of: supplying a process gas to a discharge chamber which is defined on an inner peripheral surface of a processing chamber 12, where multiple substrates are laminated and housed, and houses a pair of electrodes therein; applying electric power to the electrode to form plasma thereby activating the process gas. The steps are performed and the substrate is processed using the activated process gas. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2013065872(A) 申请公布日期 2013.04.11
申请号 JP20120249258 申请日期 2012.11.13
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 TOYODA KAZUYUKI;INOKUCHI YASUHIRO;TAKEBAYASHI MOTONARI;KONYA TADASHI;ISHIMARU NOBUO
分类号 H01L21/316;H01L21/31;H01L21/318 主分类号 H01L21/316
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