发明名称 Phase change memory cells and fabrication thereof
摘要 A phase change memory cell, e.g. a line-cell (2), and fabrication thereof, the cell comprising: two electrodes (6, 8); phase change memory material (10) and a dielectric barrier (12). The dielectric barrier (12) is arranged to provide electron tunnelling, e.g. Fowler-Nordheim tunnelling, to the phase change memory material (10). A contact (15) made of phase change memory material may also be provided. The dielectric barrier (12) is substantially uniform e.g. of substantially uniform thickness, e.g. ≧5 nm.
申请公布号 US8415226(B2) 申请公布日期 2013.04.09
申请号 US200913063782 申请日期 2009.10.02
申请人 KOCHUPURACKAL JINESH B. P.;WOLTERS ROBERTUS A. M.;ZANDT MICHAEL A. A.;TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 KOCHUPURACKAL JINESH B. P.;WOLTERS ROBERTUS A. M.;ZANDT MICHAEL A. A.
分类号 H01L21/20 主分类号 H01L21/20
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