发明名称 Method for manufacturing a power semiconductor device
摘要 An exemplary method is disclosed for manufacturing a power semiconductor device which has a first electrical contact on a first main side and a second electrical contact on a second main side opposite the first main side and at least a two-layer structure with layers of different conductivity types, and includes providing an n-doped wafer and creating a surface layer of palladium particles on the first main side. The wafer is irradiated on the first main side with ions. Afterwards, the palladium particles are diffused into the wafer at a temperature of not more than 750° C., by which diffusion a first p-doped layer is created. Then, the first and second electrical contacts are created. At least the irradiation with ions is performed through a mask.
申请公布号 US8415239(B2) 申请公布日期 2013.04.09
申请号 US20100731977 申请日期 2010.03.25
申请人 VOBECKY JAN;RAHIMO MUNAF;ABB TECHNOLOGY AG 发明人 VOBECKY JAN;RAHIMO MUNAF
分类号 H01L21/22;H01L21/225;H01L21/265 主分类号 H01L21/22
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