| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a pattern identification device capable of removing a bottleneck in memory access to an integral image to achieve a high speed performance with fewer restrictions. <P>SOLUTION: The pattern identification device identifies a predetermined pattern by calculating the feature quantity in a local area of a piece of input data. The pattern identification device includes: generating means that generates a piece of accumulation information from the input data; plural storing means that holds the accumulation information on the dimensional basis; writing means that writes the accumulation information on the plural storing means according to a predetermined rule; parallel reading means that parallely-reads the accumulation information from the plural storing means; feature quantity calculation means that calculates a local area feature quantity by using the read accumulation information; and identification means that identifies the predetermined pattern by using plural feature quantities. The relation between the number of the storing means allotted on the dimensional basis and the number of read-outs of the accumulation information is in a relation of a prime number each other. <P>COPYRIGHT: (C)2013,JPO&INPIT |
