Fine particle measuring method, substrate for measurement, and measuring apparatus

摘要

A fine particle measuring method of performing optical measurement of fine particles introduced into a plurality of sample fluidic channels (111) provided at predetermined distances on a substrate (11) by scanning light to the sample fluidic channels (111) is disclosed. The method includes: sequentially irradiating the light to at least two or more reference regions provided together with the sample fluidic channels (111); detecting a change of optical property occurring in the light due to the reference regions; and controlling timing of emission of the light to the sample fluidic channels (111).