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发明名称
检查用构造体
摘要
本发明系提供一种检查用构造体,其系安装于探针卡之电路基板之下面侧。该检查用构造体系具备台座部、安装于该台座部下面之基板状接触部、保持该台座部之保持部。接触部系由配线层、绝缘层及弹性层按此顺序从下往上积层而成,各探针系由接触部之面内之局部向下方弯曲形成,具备前述配线层、绝缘层及弹性层之积层结构。台座部之导体部内,导电线与介电体部系同轴状配置。导电线与探针及电路基板构成电性连接。
申请公布号
TWI391671
申请公布日期
2013.04.01
申请号
TW097124420
申请日期
2008.06.27
申请人
东京威力科创股份有限公司 日本
发明人
望月纯
分类号
G01R1/073
主分类号
G01R1/073
代理机构
代理人
陈长文 台北市松山区敦化北路201号7楼
主权项
地址
日本
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