PURPOSE: A power device is provided to improve the electrical reliability for the EOS/ESD of a GaN FET device. CONSTITUTION: A silicon epitaxial layer(301) is formed on a silicon substrate(300). The silicon epitaxial layer comprises a P-type ion implantation layer(303a,303b) and a p-type plug layer(302). An AlGaN/GaN epi layer(307) for a GaN FET device is formed on the p-type plug layer. A gate electrode(310a), a source electrode(310b) and a drain electrode(310c) are formed on the AlGaN/GaN epi layer.
申请公布号
KR20130031761(A)
申请公布日期
2013.03.29
申请号
KR20120000229
申请日期
2012.01.02
申请人
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE;SIGETRONICS INC.
发明人
PARK, JONG MOON;LEE, JIN HO;CHO, DEOK HO;SHIM, KYU HWAN