发明名称 SEMICONDUCTOR DEVICE VERIFYING SIGNAL SUPPLIED FROM OUTSIDE
摘要 Disclosed herein is a semiconductor device that includes a verification circuit and an error processing circuit. the verification circuit verifies second bits of an external command to generate the verification result signal. The error processing circuit supplies a follow-up signal to a bank control circuit after a lapse of a first period and a second period when the verification result signal indicates a fail state during a write operation. The first period corresponds to a write latency indicating a period between when a write command is generated and when a data associated with the write command is supplied from outside. The second period corresponds to a write recovery latency indicating a period between when the bank control circuit issues a write execution signal to start writing the data to memory cells and when the write operation is completed.
申请公布号 US2013080826(A1) 申请公布日期 2013.03.28
申请号 US201213629312 申请日期 2012.09.27
申请人 ELPIDA MEMORY, INC.;ELPIDA MEMORY, INC. 发明人 KONDO CHIKARA
分类号 G06F11/20 主分类号 G06F11/20
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