发明名称 |
SEMICONDUCTOR DEVICE VERIFYING SIGNAL SUPPLIED FROM OUTSIDE |
摘要 |
Disclosed herein is a semiconductor device that includes a verification circuit and an error processing circuit. the verification circuit verifies second bits of an external command to generate the verification result signal. The error processing circuit supplies a follow-up signal to a bank control circuit after a lapse of a first period and a second period when the verification result signal indicates a fail state during a write operation. The first period corresponds to a write latency indicating a period between when a write command is generated and when a data associated with the write command is supplied from outside. The second period corresponds to a write recovery latency indicating a period between when the bank control circuit issues a write execution signal to start writing the data to memory cells and when the write operation is completed. |
申请公布号 |
US2013080826(A1) |
申请公布日期 |
2013.03.28 |
申请号 |
US201213629312 |
申请日期 |
2012.09.27 |
申请人 |
ELPIDA MEMORY, INC.;ELPIDA MEMORY, INC. |
发明人 |
KONDO CHIKARA |
分类号 |
G06F11/20 |
主分类号 |
G06F11/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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