发明名称 FILM FORMATION METHOD AND APPARATUS FOR SEMICONDUCTOR PROCESS, AND COMPUTER READABLE MEDIUM
摘要 A silicon-containing insulating film is formed on a target substrate by CVD, in a process field to be selectively supplied with a first process gas including di-iso-propylaminosilane gas and a second process gas including an oxidizing gas or nitriding gas. The film is formed by performing a plurality of times a cycle alternately including first and second steps. The first step performs supply of the first process gas, thereby forming an adsorption layer containing silicon on a surface of the target substrate. The second performs supply of the second process gas, thereby oxidizing or nitriding the adsorption layer on the surface of the target substrate. The second step includes an excitation period of supplying the second process gas to the process field while exciting the second process gas by an exciting mechanism.
申请公布号 KR101247828(B1) 申请公布日期 2013.03.26
申请号 KR20090007354 申请日期 2009.01.30
申请人 发明人
分类号 H01L21/205 主分类号 H01L21/205
代理机构 代理人
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